THERMAL EXPANSION EXPERIMENT DEVICE
Description:
Determination of thermal expansion coefficient by optical Interference techniques The Michelson Interference path in this instrument causes change in interference fringes because of the change of the tested sample, thereby determining the variance of the sample length, and further, the linear expansion coefficient.
Details:
He-Ne Laser | 632.8nm, 1.0mW |
Sample Type | Copper, steel, Aluminum |
Sample Length | 150mm |
Heating Range | 20-60oC,temperature control |
Temperature Measurement Accuracy | 0.1oC |
Display Value Error | ±1% |
Power Consumption | 50W |
Error of Linear Expansion Coefficient | <3% |
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